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dc.contributor.authorAi, Sugitani-
dc.contributor.authorTakeshi, Watanabe-
dc.contributor.authorTribidasari, Ivandini A.-
dc.contributor.authorTatsuo, Iguchi-
dc.contributor.authorYasuaki, Einaga-
dc.description.abstractSelective anodic stripping voltammetry of trace metal ions in a mixture solution with another interfering metal was developed based on Fick's law concerning the diffusion profile of interfering metals at the electrode surface after electrolysis treatment. A boron-doped diamond film was used as the sensing electrode, while a perforated carbon sheet was used for the interference-depleting electrode. The influence of the electrode distance and the time of electrolysis on the formation of the diffusion profile was studied. As a working model, the detection of cadmium with copper interference was investigated. The advantage of the method in comparison to general electrolysis was also discussed. The method offers a new perspective for improving the selective detection of metal ions by analyzing the diffusion profiles of the interfering species at the surface of electrodes.en_US
dc.publisherRoyal Society of Chemistryen_US
dc.relation.ispartofseriesVolume 15;Issue 1-
dc.sourcePhysical Chemistry Chemical Physics, 2013, 15, 142-147en_US
dc.titleControlling the diffusion profile of electroactive species for selective anodic stripping voltammetry of cadmium at boron-doped diamond electrodesen_US
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