Please use this identifier to cite or link to this item: http://paper.sci.ui.ac.id/jspui/handle/2808.28/187
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dc.contributor.authorTribidasari, Ivandini A.-
dc.contributor.authorRangkuti, Prasmita K.-
dc.contributor.authorEinaga, Yasuaki-
dc.date.accessioned2016-08-26T02:28:25Z-
dc.date.available2016-08-26T02:28:25Z-
dc.date.issued2015-11-03-
dc.identifier.isbn978-0-7354-1376-4-
dc.identifier.otherhttp://dx.doi.org/10.1063/1.4946944en_US
dc.identifier.urihttp://paper.sci.ui.ac.id/jspui/handle/2808.28/187-
dc.description.abstractBoron-doped diamond (BDD) microelectrodes were used to observe the correlation between electrocatalytic currents caused by individual Pt nanoparticle (Pt-np) collisions at the electrode. The BDD microelectrodes, ~20 μm diameter and ~2 μm particle size, were fabricated at the surface of tungsten wires. Pt-np with a size of 1 to 5 nm with agglomerations up to 20 nm was used for observation. The electrolytic currents were observed via catalytic reaction of 15 mM hydrazine in 50 mM phosphate buffer solution at Pt-np at 0.4 V when it collides with the surface of the microelectrodes. The low current noise and wider potential window in the measurements using BDD microelectrode produced a better results, which represents a better correlation to the TEM result of the Pt-np, compared to when gold microelectrodes was used.en_US
dc.language.isoen_USen_US
dc.publisherAIP Publishingen_US
dc.relation.ispartofseriesVolume 1729;-
dc.sourceInternational Symposium on Current Progress in Mathematics and Sciences (ISCPMS), Hotel Margo, Depok, 3-4 November 2015, AIP Conf. Proc. 1729, 020041en_US
dc.source.urihttp://scitation.aip.org/content/aip/proceeding/aipcp/10.1063/1.4946944en_US
dc.titleScreening Metal Nanoparticles Using Boron-Doped Diamond Microelectrodesen_US
dc.typeArticleen_US
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